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Materials Characterization


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The use of sophisticated characterization techniques in investigating atomic and nanoscale structures and properties of materials plays a central role in the research programs of nearly all faculty in the Materials Science & Engineering program. These techniques include calorimetry (Castro and Navrotsky), solid-state nuclear magnetic resonance and other spectroscopies (Sen), scanning probe microscopy (Kim and Takamura), advanced transmission electron microscopy (van Benthem), and electrical impedance spectroscopy (Kim). In addition, many of the faculty make use of the unique capabilities available at DOE- and NSF-funded user facilities which include soft x-ray magnetic spectroscopy and photoemission electron microscopy, high-resolution x-ray diffraction (Takamura), small angle x-ray scattering, high energy x-ray and neutron scattering (Sen, Navrotsky), high-field nuclear magnetic resonance spectroscopy (Sen), and ultra-high-resolution and dynamic TEM/STM (van Benthem).  These experiments are carried out at Advanced Light Source (ALS), Advanced Photon Source (APS), Stanford Synchrotron Radiation Lightsource (SSRL) and Spallation Neutron Source (SNS), Oak Ridge National Lab (ORNL), and National High Magnetic Field Laboratory (NHMFL).

About the Faculty