uc davis materials science engineering amcat jeol jem 2100f ac tem
The JEOL 2100F transmission electron microscope allows researchers to view and map atoms and bonds in any material at temperatures ranging from 50ºC to 1,200ºC. Photo: Alexander Fisher-Wagner/UC Davis.


The JEOL 2100F is a transmission electron microscope (TEM) which is operated in both TEM and STEM configurations. The JEOL 2100F is equipped with a Schottky FEG, which operates at 200 kV. It is also equipped with a CEOS aberration corrector for the probe-forming optics, which corrects for aberrations up to the third-order. The JEOL 2100F is equipped with a new Gatan Rio 16 CMOS camera for TEM bright field and dark field imaging, and is capable of acquiring 1k x 1k images at 160 frames per second. For chemical and compositional analysis, the JEOL 2100F is equipped with a windowless EDS system and a post-column GIF.


  • Accelerating voltage: 200 kV.

  • Spatial resolution (HRTEM): 2.3 Å (point-to-point).

  • Spatial resolution (STEM): 1.0 Å.

  • Energy resolution: 0.7 eV.

uc davis materials science engineering amcat jeol jem 2100f ac tem
The JEOL 2100F includes an aberration corrector for probe-forming optics, which corrects aberrations up to the third order. An aberration corrector is like glasses for an electron microscope. It forms images with electron beams rather than light that your eyes use. Photo: Alexander Fisher-Wagner/UC Davis.



  • Aberration-corrected scanning transmission electron microscopy (STEM).

    • High-angle annular dark field imaging (HAADF-STEM).

    • Bright field imaging (BF STEM).

  • Analytical electron microscopy (AEM).

    • Electron energy loss spectroscopy (EELS).

    • Energy-dispersive x-ray spectroscopy (EDS).

    • Energy-filtered TEM (EFTEM).

  • Transmission electron microscopy (TEM).

    • Diffraction contrast (TEM bright field and dark field).

    • Weak-beam imaging.

    • Selected area diffraction (SAED).

  • In-situ transmission electron microscopy.

    • Heating up to 1000°C (Gatan heating).

    • Electrical testing and micro-manipulation (STM-TEM).

    • Combined heating (1200°C) and biasing (Protochips Aduro).

    • Cryo-electron microscopy (liquid N₂).


  • Gatan Tridem GIF (EFTEM, EELS). 

  • Oxford X-MaxN TSR EDS detector. 


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