Transmission Electron Microscopy

Description

JEOL 2100F transmission electron microscope
The JEOL 2100F transmission electron microscope allows researchers to view and map atoms and bonds in any material at temperatures ranging from 50ºC to 1,200ºC. (Alexander Fisher-Wagner/UC Davis)

The JEOL 2100F is a transmission electron microscope (TEM) which is operated in both TEM and scanning-TEM (STEM) configurations. The JEOL 2100F is equipped with a 200 kV Schottky field emission gun, and a CEOS aberration corrector for the probe-forming optics to correct for aberrations up to the third-order. The JEOL 2100F is equipped with a new Gatan Rio 16 CMOS camera for TEM bright field and dark field imaging, and is capable of acquiring 1k x 1k images at 160 frames per second. For chemical and compositional analysis, the JEOL 2100F is equipped with a windowless energy dispersive x-ray spectroscopy (EDS) system and a post-column Gatan imaging filter (GIF). 

Specifications

  • Accelerating voltage: 200 kV
  • Spatial resolution (HRTEM): 2.3 Å (point-to-point)
  • Spatial resolution (STEM): 1.0 Å
  • Energy resolution: 0.7 eV

Capabilities 

Imaging 
  • Transmission Electron Microscopy (TEM)
    • Bright Field Imaging (BF TEM)
    • Diffraction Contrast (TEM BF and Dark Field)
    • Weak-Beam Imaging
    • Selected Area Electron Diffraction (SAED).
  • Aberration-corrected Scanning Transmission Electron Microscopy (STEM)
    • High-angle Annular Dark Field Imaging (HAADF-STEM)
    • Bright Field STEM (BF STEM)
    In-situ Holders
    • Electrical testing and micro-manipulation (STM-TEM)
    • Combined heating (1200°C) and biasing (Protochips Aduro)
    • Cryo-electron microscopy (liquid N₂).
    • Heating up to 1000°C (Gatan heating).
    Analytical
    • Energy-filtered TEM (EF-TEM) and Electron Energy Loss Spectroscopy (EELS) with Gatan Tridem GIF
    • Energy-dispersive x-ray spectroscopy (EDS) with Oxford X-MaxN TSR EDS detector. 

    Location

    113 Kemper Hall.

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