Description
The JEOL 2100F is a transmission electron microscope (TEM) which is operated in both TEM and STEM configurations. The JEOL 2100F is equipped with a Schottky FEG, which operates at 200 kV. It is also equipped with a CEOS aberration corrector for the probe-forming optics, which corrects for aberrations up to the third-order. The JEOL 2100F is equipped with a new Gatan Rio 16 CMOS camera for TEM bright field and dark field imaging, and is capable of acquiring 1k x 1k images at 160 frames per second. For chemical and compositional analysis, the JEOL 2100F is equipped with a windowless EDS system and a post-column GIF.
Specifications
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Accelerating voltage: 200 kV.
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Spatial resolution (HRTEM): 2.3 Å (point-to-point).
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Spatial resolution (STEM): 1.0 Å.
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Energy resolution: 0.7 eV.
Capabilities
Imaging
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Aberration-corrected scanning transmission electron microscopy (STEM).
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High-angle annular dark field imaging (HAADF-STEM).
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Bright field imaging (BF STEM).
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Analytical electron microscopy (AEM).
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Electron energy loss spectroscopy (EELS).
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Energy-dispersive x-ray spectroscopy (EDS).
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Energy-filtered TEM (EFTEM).
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Transmission electron microscopy (TEM).
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Diffraction contrast (TEM bright field and dark field).
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Weak-beam imaging.
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Selected area diffraction (SAED).
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In-situ transmission electron microscopy.
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Heating up to 1000°C (Gatan heating).
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Electrical testing and micro-manipulation (STM-TEM).
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Combined heating (1200°C) and biasing (Protochips Aduro).
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Cryo-electron microscopy (liquid N₂).
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Analytical
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Gatan Tridem GIF (EFTEM, EELS).
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Oxford X-MaxN TSR EDS detector.
Location
113 Kemper Hall.
Recharge Rates Per Hour
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Internal unassisted: $58.82
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Internal assisted/training: $117.69
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External unassisted: $78.64
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External assisted/training: $157.36
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Commercial unassisted: $249.17
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Commercial assisted/training: $327.89