Equipment

uc davis materials science engineering amcat equipment

AMCaT has Equipment Available for all Your Materials Characterization Needs

Below is a list of all the equipment available for use in AMCaT. For a list of recharge rates for each piece of equipment, visit our "Recharge Rates" page.

  • JEOL JEM 2100F-AC TEM 
  • Uses
    BF, DF, STEM, TEM, HAADF, EDS, PEELS, Selected area diffraction.

    About
    The JEOL 2100F is a transmission electron microscope (TEM) which is operated in both TEM and STEM configurations. The JEOL 2100F is equipped with a Schottky FEG, which operates at 200 kV. It is also equipped with a CEOS aberration corrector for the probe-forming optics, which corrects for aberrations up to the third-order. The JEOL 2100F is equipped with a new Gatan Rio 16 CMOS camera for TEM bright field and dark field imaging, and is capable of acquiring 1k x 1k images at 160 frames per second. For chemical and compositional analysis, the JEOL 2100F is equipped with a windowless EDS system and a post-column GIF.

    Details
  • Materials Sample Preparation Laboratory
  • Uses
    Materials sample prep.

    About
    The materials sample preparation laboratory is used to prepare a variety of materials for SEM, TEM and optical microscopy analysis. Users have full access to the sample preparation laboratory once they have completed the necessary training.

    Details
  • PANalytical X’Pert Pro MRD 
  • Uses
    Structural characterization of thin films and inorganic materials.

    About
    The PANalytical X’Pert Pro is a multipurpose x-ray diffractometer equipped with a Cu Kα source. The X’Pert Pro is capable of both high-resolution and lower-resolution measurements and enables a wide range of thin film and powder sample analysis.

    Details
  • Spark Plasma Sintering (SPS) 
  • Uses
    Rapid sintering.

    About

    Spark plasma sintering (SPS), also known as the field-assisted sintering technique (FAST) or pulsed electric current sintering (PECS), is a rapid sintering method with high heating and cooling rates (up to 1000 K/min) and high loads (35 kN), making the sintering process extremely fast (within a few minutes).

    The SPS is used in the fabrication of functionally-graded materials, intermetallic compounds, ceramics, metal matrix composites and nanocrystalline materials, which are difficult to sinter by conventional methods.

    Details

  • Thermo Fisher Quattro S Environmental SEM
  • Uses

    Secondary and backscattered electron imaging of inorganic and organic samples, in-situ observation of materials behavior under mechanical stress and at high temperatures.


    About
    The Thermo Fisher Quattro S is an environmental scanning electron microscope (SEM), equipped with a Schottky FEG. It is capable of operating at pressures up to 50 mbar. The large pressure range allows the user to acquire images of hydrated specimens. The low vacuum regime also enables users to take images of non-conducting samples without coating their samples in gold or carbon. 

    The Quattro S is equipped with an in-situ heating stage, which is capable of heating a sample from room temperature up to 1400°C. 

    Details
  • Zeiss Axio LSM 700
  • Uses
    Non-contact profilometry, confocal fluorescence imaging


    About
    The Zeiss Axio LSM 700 is a laser scanning confocal microscope equipped with a 488 nm solid-state laser. The instrument is ideal for non-contact profilometry, as well as routine confocal fluorescence imaging.

    Details
  • Zeiss Axio CSM 700
  • Uses
    2D and 3D topography.

    About
    The Zeiss Axio CSM 700 is a confocal microscope that can acquire 3D topography in true color. The instrument’s unique configuration allows extremely rapid data collection. A scanning stage and automated stitching algorithms permit routine analysis of large sample areas.


    Details