PANalytical X'Pert Pro MRD

uc davis materials science engineering amcat panalytical xpert pro mrd
Photo: Reeta Asmai/UC Davis.

Description

The PANalytical X’Pert Pro is a multipurpose x-ray diffractometer equipped with a Cu Kα source. The X’Pert Pro is capable of both high-resolution and lower-resolution measurements and enables a wide range of thin film and powder sample analysis.

The X’Pert Pro is a modular system, making it very easy to switch between different measurement modes.

Specifications

Available hardware includes:

  • Two, two-bounce Ge monochromators for both incident & diffracted beam optics.

  • An automatic beam attenuator for the incident beam optics made of a Ni foil.

  • Masks ranging from 2 mm to 20 mm.

  • Divergence slits ranging from 1/2° to 1/32°.

  • Nickel and copper filters.

Capabilities

Thin film

  • HR-XRD (symmetric and asymmetric rocking curve and coupled-scan measurements).

  • Reciprocal space mapping.

  • Reflectivity measurements.

  • Epitaxy software for advanced modeling of layered structures.

Powder diffraction

  • Coupled 2theta-⍵ scans for phase analysis.

  • Access to ICDD PDF 4 (2012) for phase analysis.
uc davis materials science engineering amcat panalytical xpert pro mrd
Photo: Reeta Asmai/UC Davis.

Location

135 Kemper Hall.

Recharge Rates per Hour

  • Internal unassisted: $15.00.

  • Internal assisted/training: $50.00.

  • External unassisted: $20.00.

  • External assisted/training: $55.00.

  • Commercial: $197.00.