Description
Rigaku SmartLab Thin Film X-ray Diffractometer
Rigaku SmartLab Thin Film X-ray Diffraction System (acquired via MRI award #2216198, PI: Yayoi Takamura, co-PIs: Kukreja, Hong, Velazquez, Sen) is dedicated for the full structural characterization of thin film samples. These capabilities will include x-ray reflectivity, high-resolution x-ray diffraction, reciprocal space maps (RSMs), pole figures, texture analysis, and grazing incidence x-ray diffraction. The system will be equipped with a state-of-the-art 2D HyPix-3000 detector to enable high-resolution measurements in 0D, 1D, and 2D modes leading to substantial decreases in data acquisition times (i.e., RSM measurements which would take 6+ hours on the predecessor Bruker D8 Discover and PANalytical X-Pert Pro diffractometers, can be acquired within a few minutes). In addition, it features dual energy discriminators which allows the user to adjust the energy threshold to suppress fluorescence and to eliminate cosmic rays and white radiation for optimized signal-to-noise. The Cross Beam Optics (CBO) with parabolic mirror allows for both parafocusing Bragg-Brentano geometry as well as parallel beam geometry in combination with a Ge (220) 2-bounce incident beam monochromator to select only Cu Kα1 radiation. The rapid acquisition times will enable in situ measurements as a function of temperature using low/high temperature and environment-controlled sample stages (Anton Parr DSC 500 – capable of reaching temperatures from -180 °C to 500 °C). The in-plane diffraction attachment provides and additional detector scanning axis orthogonal to the theta/2-theta diffraction plane allowing measurement of planes parallel to the sample surface. This degree of freedom greatly improves the diffractometer versatility and allows the measurement of in-plane structure factors from epitaxial films, in-plane reciprocal space maps from ultra-thin (a few nm) films, and full pole figures without the need for sample re-mounting and transmission measurements as required by conventional Eulerian cradle geometries. A MicroArea Measurement package consists of a CBO-f polycapillary which converts the line focus parallel beam from the CBO parabolic mirror into a point shaped beam of 400 microns in diameter. It enables high intensity point focus applications without switching the x-ray tube from line to point focus position. A CCD camera is available for sample positioning and viewing. Furthermore, the enclosure is large enough to support ancillary equipment for the application of electric fields and laser illumination.
Rigaku SmartLab Powder X-ray Diffractometer
Rigaku SmartLab Powder X-ray Diffraction System (acquired via MRI award #2216198, PI: Yayoi Takamura, co-PIs: Kukreja, Hong, Velazquez, Sen) is dedicated for the full structural characterization of powder samples and nanomaterials. These capabilities will include powder diffraction, grazing incidence small/wide angle x-ray scattering (GI-SAXS and GI-WAXS), and pair distribution function (PDF) measurements. The system will be equipped with both Cu and Ag x-ray tubes and a state-of-the-art 2D HyPix-3000HE detector specially configured for the Ag tube to enable high-resolution measurements in 0D, 1D, and 2D modes leading to substantial decreases in data acquisition times. In addition, it features dual energy discriminators which allows the user to adjust the energy threshold to suppress fluorescence and to eliminate cosmic rays and white radiation for optimized signal-to-noise. The CBO with parabolic mirror allows for both parafocusing Bragg-Brentano geometry as well as parallel beam geometry, while the with Elliptical Mirror (CBO-Eauto) allows for automatic switching between convergent beam and Bragg-Brentano optical configurations for focusing transmission and reflection mode powder diffraction geometries as needed for PDF measurements. Additional special measurement capabilities include the capillary attachment with sample-spinning capability, and both 2D GI-SAXS and GI-WAXS measurements for polymers and fibers. The rapid acquisition times will enable in situ measurements as a function of temperature using low/high temperature and environment-controlled sample stages. An Anton Paar HTK 2000 High Temperature Chamber heats samples to extremely high temperatures using a tungsten heating strip in vacuum up to 2300 °C. Moreover, the enclosure is large enough to support ancillary equipment for the application of electric fields and laser illumination.