PANalytical X'Pert Pro MRD

uc davis materials science engineering amcat panalytical xpert pro mrd
Photo: Reeta Asmai/UC Davis.

Description

The PANalytical X’Pert Pro is a multipurpose x-ray diffractometer equipped with a Cu Kα source. The X’Pert Pro is capable of both high-resolution and lower-resolution measurements and enables a wide range of thin film and powder sample analysis.

The X’Pert Pro is a modular system, making it very easy to switch between different measurement modes.

Specifications

Available hardware includes:

  • Two, two-bounce Ge monochromators for both incident & diffracted beam optics.

  • An automatic beam attenuator for the incident beam optics made of a Ni foil.

  • Masks ranging from 2 mm to 20 mm.

  • Divergence slits ranging from 1/2° to 1/32°.

  • Nickel and copper filters.

Capabilities

Thin film

  • HR-XRD (symmetric and asymmetric rocking curve and coupled-scan measurements).

  • Reciprocal space mapping.

  • Reflectivity measurements.

  • Epitaxy software for advanced modeling of layered structures.

Powder diffraction

  • Coupled 2theta-⍵ scans for phase analysis.

uc davis materials science engineering amcat panalytical xpert pro mrd
Photo: Reeta Asmai/UC Davis.

Location

135 Kemper Hall.

Recharge Rates Per Hour

  • Internal unassisted: $40.00

  • Internal assisted/training: $96.75

  • External unassisted: $53.50

  • External assisted/training: $129.25

  • Commercial unassisted: $77.00

  • Commercial assisted/training: $152.75