Description
The PANalytical X’Pert Pro is a multipurpose x-ray diffractometer equipped with a Cu Kα source. The X’Pert Pro is capable of both high-resolution and lower-resolution measurements and enables a wide range of thin film and powder sample analysis.
The X’Pert Pro is a modular system, making it very easy to switch between different measurement modes.
Specifications
Available hardware includes:
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Two, two-bounce Ge monochromators for both incident & diffracted beam optics.
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An automatic beam attenuator for the incident beam optics made of a Ni foil.
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Masks ranging from 2 mm to 20 mm.
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Divergence slits ranging from 1/2° to 1/32°.
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Nickel and copper filters.
Capabilities
Thin film
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HR-XRD (symmetric and asymmetric rocking curve and coupled-scan measurements).
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Reciprocal space mapping.
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Reflectivity measurements.
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Epitaxy software for advanced modeling of layered structures.
Powder diffraction
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Coupled 2theta-⍵ scans for phase analysis.
Location
135 Kemper Hall.
Recharge Rates Per Hour
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Internal unassisted: $40.23
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Internal assisted/training: $99.11
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External unassisted: $53.79
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External assisted/training: $132.51
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Commercial unassisted: $77.26
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Commercial assisted/training: $155.98