Description

The PANalytical X’Pert Pro is a multipurpose x-ray diffractometer equipped with a Cu Kα source. The X’Pert Pro is capable of both high-resolution and lower-resolution measurements and enables a wide range of thin film and powder sample analysis.

The X’Pert Pro is a modular system, making it very easy to switch between different measurement modes.

Specifications

Available hardware includes:

• Two, two-bounce Ge monochromators for both incident & diffracted beam optics.

• An automatic beam attenuator for the incident beam optics made of a Ni foil.

• Masks ranging from 2 mm to 20 mm.

• Divergence slits ranging from 1/2° to 1/32°.

• Nickel and copper filters.

Capabilities

Thin film

• HR-XRD (symmetric and asymmetric rocking curve and coupled-scan measurements).

• Reciprocal space mapping.

• Reflectivity measurements.

• Epitaxy software for advanced modeling of layered structures.

Powder diffraction

• Coupled 2theta-⍵ scans for phase analysis.

• Access to ICDD PDF 4 (2012) for phase analysis.

Location

135 Kemper Hall.

Recharge Rates per Hour

• Internal unassisted: $15.00.

• Internal assisted/training: $50.00.

• External unassisted: $20.00.

• External assisted/training: $55.00.

• Commercial: $197.00.